Specifications
- Atomic lattice resolution on inverted microscope in closed-loop (<0.030 nm RMS z height noise level)
- Ultra-low noise level of cantilever deflection detection system < 2 pm RMS free (0.1 Hz -1 kHz)
- Highest detector bandwidth of 8 MHz for high speed signal capture
- Tip-scanning, stand-alone system, with a rigid low-noise design and drift-minimized mechanics
- The only liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
- IR deflection detection light source with low coherence
- Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
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Scanner unit
- 100×100×15 μm³ scan range with 1.5 μm extra z range with high-speed option
- Sensor noise level < 0.09 nm RMS in xy
- 0.04 nm RMS sensor noise level in z
Vortis 2 SPMControl electronics
- State-of-the art digital controller noise with lowest noise levels and highest flexibility
New workflow-based V7 SPMControl software
- True multi-user platform, perfect for imaging facilities
- User-programmable software
- Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
- New DirectOverlay 2 for combined optical and AFM information
- Improved ForceWatch™ and TipSaver™ mode for force spectroscopy and imaging
- Advanced spectroscopy modes such as various force clamp modes or ramp designs
- Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
- Powerful batch processing of force curves and images including WLC, FJC, step-fitting, JKR, DMT model and other analyses
Stages and sample holders
- Stages are available for all major inverted optical microscope manufacturers such as Zeiss, Nikon, Olympus and Leica
- Motorized precision stage with 20×20 mm2 travel range with joystick or software control
- Manual precision with 20×20 mm2 travel range
- Holders for Petri dishes, coverslips, microscope slides or metal SPM discs are available
- Large Ø140×18 mm3 free sample volume up to 14 cm in z with new Head-Up stage
Largest number of accessories and probes
- Large choice of temperature controls (for ambient, liquid and gas), liquid cells even for aggressive solvents
- Vibration and acoustic isolation from leading suppliers
Optical configurations
- Fits on inverted microscopes from
- Zeiss (Axio Observer, Axio Vert 100/200, Axio Vert A1)
- Olympus (IX line)
- Nikon (TE 2000, Ti/Ti2 line)
- Leica (DMi line)
- AFM simultaneously with optical microscopy
- Fully simultaneous operation with optical phase contrast and DIC using standard condensers
- Combine AFM with advanced commercial confocal microscopes and fluorescence optical techniques such as FCS, FRET, TIRF, FLIM, FRAP, STED, STORM/PALM, SIM and more
- TopViewOptics video optics for opaque samples with 12× zoom
- BioMAT option (see BioMAT brochure)
- For high-NA upright fluorescence optics combined with AFM on opaque samples
- Supports upright research microscopes such as Zeiss Axio Imager and Axioscope, Olympus, BX51/53 and BX FM, LEXT, Leica DM, 4000/5000
- Upright Fluorescence Microscope (UFM) Kit
- Enables the combined use of AFM and upright optical fluorescence microscopes such as Zeiss Axio Zoom V16, Leica Macroscope Z16, ApoA, Leica M100/200 line, Olympus MVX 10 MacroView
- Large range of supported cameras
- High-end EM-CCD cameras such as models from Andor (iXon)(1), Hamamatsu(3) and Photometrics (Evolve) (3)
- sCMOS cameras from Andor (Zyla)(1) , Hamamatsu (Orca) (3), PCO (2)
- CCD and CMOS cameras from Jenoptik(2), IDS(1) , μEye(1) or PCO (2)
(1)Native, (2)On-board, (3)Communication link
Standard operating modes
Imaging modes
- Now with PeakForce Tapping
- Contact mode with lateral force microscopy (LFM)
- Tapping Mode™ with PhaseImaging™
Force measurements
- Static and dynamic spectroscopy
- Advanced force mapping
Optional Modes
- Fast Scanning option with up to 150 lines/sec
- Fast QI Advanced mode for quantitative data, perfect for soft samples
- Mechanical properties such as adhesion, elasticity, stiffness, deformation
- Conductivity and charge distribution mapping
- Contact Point Imaging (CPI) with zero force
- Molecular recognition imaging for binding site mapping
- Advanced AC modes such as FM and PM with Q-control & Active
- Gain Control
- Higher harmonics imaging
- Kelvin Probe Microscopy and SCM MFM and EFM (see also QI mode)
- Conductive AFM (see also QI mode)
- STM
- Electrical spectroscopy modes
- Piezoresponse Microscopy for high voltages
- Electrochemistry with temperature control and optical microscopy
- NanoLithography
- NanoManipulation
- Nanoindentation
- Scanning Thermal AFM
- FluidFM® solution from Cytosurge
- ExperimentPlanner for designing a specific measurement workflow
- RampDesigner™ for custom designed clamp and ramp experiments
- ExperimentControl feature for remote experiment control
- DirectOverlay 2 for combined AFM and optical microscopy
- Additional XY or Z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module