Specifications

• Atomic lattice resolution on inverted microscope in closed-loop (<0.030 nm RMS z height noise level)
• Ultra-low noise level of cantilever deflection detection system < 2 pm RMS free (0.1 Hz -1 kHz)
• Highest detector bandwidth of 8 MHz for high speed signal capture
• Tip-scanning, stand-alone system, with a rigid low-noise design and drift-minimized mechanics
• The only liquid-safe AFM with integrated vapor barrier, special encapsulated piezo drives and tip-moving design
• IR deflection detection light source with low coherence
• Transmission illumination with standard condensers for precise brightfield, DIC and phase contrast
• Scanner unit
  • 100×100×15 μm³ scan range with 1.5 μm extra z range with high-speed option
  • Sensor noise level < 0.09 nm RMS in xy
  • 0.04 nm RMS sensor noise level in z

Vortis 2 SPMControl electronics

• State-of-the art digital controller noise with lowest noise levels and highest flexibility

New workflow-based V7 SPMControl software

• True multi-user platform, perfect for imaging facilities
• User-programmable software
• Fully automated sensitivity and spring constant calibration using thermal noise or Sader method
• New DirectOverlay 2 for combined optical and AFM information
• Improved ForceWatch™ and TipSaver™ mode for force spectroscopy and imaging
• Advanced spectroscopy modes such as various force clamp modes or ramp designs
• Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
• Powerful batch processing of force curves and images including WLC, FJC, step-fitting, JKR, DMT model and other analyses

Stages and sample holders

• Stages are available for all major inverted optical microscope manufacturers such as Zeiss, Nikon, Olympus and Leica
• Motorized precision stage with 20×20 mm² travel range with joystick or software control
• Manual precision with 20×20 mm² travel range
• Holders for Petri dishes, coverslips, microscope slides or metal SPM discs are available
• Large Ø140×18 mm³ free sample volume up to 14 cm in z with new Head-Up stage

Largest number of accessories and probes

• Large choice of temperature controls (for ambient, liquid and gas), liquid cells even for aggressive solvents
• Vibration and acoustic isolation from leading suppliers

Optical configurations

• Fits on inverted microscopes from
  • Zeiss (Axio Observer, Axio Vert 100/200, Axio Vert A1)
  • Olympus (IX line)
  • Nikon (TE 2000, Ti/Ti2 line)
  • Leica (DMi line)
• AFM simultaneously with optical microscopy
  • Fully simultaneous operation with optical phase contrast and DIC using standard condensers
  • Combine AFM with advanced commercial confocal microscopes and fluorescence optical techniques such as FCS, FRET, TIRF, FLIM, FRAP, STED, STORM/PALM, SIM and more
• TopViewOptics video optics for opaque samples with 12× zoom
• BioMAT option (see BioMAT brochure)
• For high-NA upright fluorescence optics combined with AFM on opaque samples
• Supports upright research microscopes such as Zeiss Axio Imager and Axioscope, Olympus, BX51/53 and BX FM, LEXT, Leica DM, 4000/5000
• Upright Fluorescence Microscope (UFM) Kit
  • Enables the combined use of AFM and upright optical fluorescence microscopes such as Zeiss Axio Zoom V16, Leica Macroscope Z16, ApoA, Leica M100/200 line, Olympus MVX 10 MacroView
• Large range of supported cameras
  • High-end EM-CCD cameras such as models from Andor (iXon)⁽¹⁾, Hamamatsu⁽³⁾ and Photometrics (Evolve) ⁽³⁾
  • sCMOS cameras from Andor (Zyla)⁽¹⁾ , Hamamatsu (Orca) ⁽³⁾, PCO ⁽²⁾
  • CCD and CMOS cameras from Jenoptik⁽²⁾, IDS⁽¹⁾ , μEye⁽¹⁾ or PCO <sup>(2)
    
    (1)</sup>Native, ⁽²⁾On-board, ⁽³⁾Communication link